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Apple v. Samsung – The Federal Circuit Punts to the District Court to Determine the Test for Design Patent Damages


IP Litigator
By: Scott W. Doyle, Robert M. Masters, Jonathan R. DeFosse and Ted M. Nissly 

IP Litigator published an article authored by litigation partners Scott W. Doyle, Robert M. Masters, Jonathan R. DeFosse and litigation associate Ted M. Nissley titled “Apple v. Samsung – The Federal Circuit Punts to the District Court to Determine the Test for Design Patent Damages.”

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